• DocumentCode
    591677
  • Title

    Electroluminescence properties of porous silicon nanostructures with optimum current density of photo-electrochemical anodisation

  • Author

    Zubaidah, M.A. ; Asli, N. ; Rusop, M. ; Abdullah, Saad

  • Author_Institution
    Fac. of Appl. Sci., Univ. Teknol. MARA, Shah Alam, Malaysia
  • fYear
    2012
  • fDate
    23-26 Sept. 2012
  • Firstpage
    23
  • Lastpage
    26
  • Abstract
    P-type silicon wafer (<;100>; orientation; boron doping; 0.75 ~ 10 Ωcm-1) was used to prepare samples of porous silicon nanostructures (PSiNs). All samples have been prepared by using photo-electrochemical anodization. A fixed etching time of 30 minutes and volume ratio of electrolyte, hydrofluoric acid 48% (HF48%) and absolute ethanol (C2H5OH), 1:1 were used for various current densities, J. There were sample A (J=10 mA/cm2), sample B (J=20 mA/cm2), sample C (J=30 mA/cm2), sample D (J=40 mA/cm2) and sample E (J=50 mA/cm2). Photoluminescence (PL) and EL spectra were investigated. Maximum peak position of PL spectrum at about ~675 nm, while the maximum EL spectrum at about ~650 nm (which is similar to the PL spectrum).
  • Keywords
    anodisation; current density; electroluminescence; electrolytes; elemental semiconductors; etching; nanofabrication; nanoporous materials; photoelectrochemistry; photoluminescence; porous semiconductors; semiconductor growth; silicon; EL spectra; PL spectrum; Si; boron doping; electroluminescence properties; electrolyte; ethanol; hydrofluoric acid; maximum peak position; optimum current density; p-type silicon wafer orientation; photoelectrochemical anodisation; photoluminescence spectra; porous silicon nanostructures; time 30 min; Atmospheric measurements; Current density; Electrodes; Electroluminescence; Nanostructures; Photoluminescence; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Business, Engineering and Industrial Applications (ISBEIA), 2012 IEEE Symposium on
  • Conference_Location
    Bandung
  • Print_ISBN
    978-1-4577-1632-4
  • Type

    conf

  • DOI
    10.1109/ISBEIA.2012.6422878
  • Filename
    6422878