• DocumentCode
    592146
  • Title

    Collective Churn Prediction in Social Network

  • Author

    Oentaryo, Richard J. ; Ee-Peng Lim ; Lo, Daniel ; Zhu, Feida ; Prasetyo, P.K.

  • Author_Institution
    Sch. of Inf. Syst., Singapore Manage. Univ., Singapore, Singapore
  • fYear
    2012
  • fDate
    26-29 Aug. 2012
  • Firstpage
    210
  • Lastpage
    214
  • Abstract
    In service-based industries, churn poses a significant threat to the integrity of the user communities and profitability of the service providers. As such, research on churn prediction methods has been actively pursued, involving either intrinsic, user profile factors or extrinsic, social factors. However, existing approaches often address each type of factors separately, thus lacking a comprehensive view of churn behaviors. In this paper, we propose a new churn prediction approach based on collective classification (CC), which accounts for both the intrinsic and extrinsic factors by utilizing the local features of, and dependencies among, individuals during prediction steps. We evaluate our CC approach using real data provided by an established mobile social networking site, with a primary focus on prediction of churn in chat activities. Our results demonstrate that using CC and social features derived from interaction records and network structure yields substantially improved prediction in comparison to using conventional classification and user profile features only.
  • Keywords
    pattern classification; social networking (online); user interfaces; chat activity; collective churn prediction method; collective classification; interaction record; network structure; service provider profitability; service-based industry; social factor; social network; user community; user profile factor; Accuracy; Communities; Mobile communication; Social network services; Support vector machines; Testing; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Social Networks Analysis and Mining (ASONAM), 2012 IEEE/ACM International Conference on
  • Conference_Location
    Istanbul
  • Print_ISBN
    978-1-4673-2497-7
  • Type

    conf

  • DOI
    10.1109/ASONAM.2012.44
  • Filename
    6425761