• DocumentCode
    59290
  • Title

    A Parallel Genetic Algorithm for Optimizing an Industrial Inspection System

  • Author

    Gonzalez Bulnes, Francisco ; Usamentiaga, Ruben ; Fernando Garcia, Daniel ; Molleda, Julio

  • Author_Institution
    Univ. de Oviedo, Gijon, Spain
  • Volume
    11
  • Issue
    6
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    1338
  • Lastpage
    1343
  • Abstract
    Periodical defect detection is a task of great importance during the production of web materials. It can reduce the appearance of a large number of surface defects, which is of vital importance to keep the product quality. In this article, a system used to detect these defects is optimized. This is carried out by looking for the optimal values for each of its configuration parameters. Since the search space formed by these parameters is very large, it cannot be explored exhaustively. For this reason, an intelligent search, like genetic algorithms, must be used. Because the fitness function is computationally heavy, a single computer would take a long time to provide an acceptable solution. For this reason, a cluster of computers is used instead, running a parallel genetic algorithm. Thus, the optimal configuration could be determined in only a few hours.
  • Keywords
    genetic algorithms; inspection; parallel machines; product quality; production engineering computing; configuration parameters; industrial inspection system; intelligent search; parallel genetic algorithm; periodical defect detection; product quality; surface defects; web materials production; Computational modeling; Computers; Genetic algorithms; Inspection; Manuals; Silicon; genetic algorithm; inspection system; parallel; periodical defects;
  • fLanguage
    English
  • Journal_Title
    Latin America Transactions, IEEE (Revista IEEE America Latina)
  • Publisher
    ieee
  • ISSN
    1548-0992
  • Type

    jour

  • DOI
    10.1109/TLA.2013.6710381
  • Filename
    6710381