Title :
Binary Software Vulnerability Analysis Based on Bidirectional-Slicing
Author :
Yu Lu ; Shen Yi ; Zhang Lei ; Yao Xinlei
Author_Institution :
North Electron. Equipments Res. Inst., Beijing, China
Abstract :
Tradition reversing engineering technology is widely used to find security vulnerabilities of binary programs. However, it calls for human participation and relies on the analyzers´ experience. In this paper, we propose a fault localization method based on bidirectional-slicing technology to help find the codes that cause the exception. This method develops novel optimizations on the traditional dynamic slicing and can obtain the key instruction sequences that lead to the exception efficiently. This method is proved to be efficient by both known and unknown vulnerabilities.
Keywords :
optimisation; program slicing; reverse engineering; security of data; software fault tolerance; analyzers experience; bidirectional-slicing technology; binary programs; binary software vulnerability analysis; dynamic slicing; fault localization method; human participation; key instruction sequences; optimizations; reversing engineering technology; security vulnerabilities; Bismuth; Electronic equipment; Equations; Erbium; Security; Software; Vectors; automation; bidirectional slicing; binary software; vulnerability analysis;
Conference_Titel :
Instrumentation, Measurement, Computer, Communication and Control (IMCCC), 2012 Second International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4673-5034-1
DOI :
10.1109/IMCCC.2012.203