Title :
A greedy approach for floopanning mass modules
Author :
Jyh Perng Fang ; Yang Lang Chang ; Jong Yu Jen ; Tai-Long Wang
Author_Institution :
Dept. of Electr. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
Abstract :
Because of its efficiency in evaluating area cost and perturbation, slicing structure had been widely used to represent a floorplan in a VLSI decades ago. Due to the possibility of relatively higher dead space, slicing structure is almost replaced by non-slicing structure to represent a floorplan or placement now. However, with the fast growing of chip complexity, the amount of modules/transistors in a chip lengthens the computation time for flooplanning dramatically. Besides, since the dimension of bounding box should be fixed, the constraint of dead space in a floorplan is not as tight as we thought before. In other words, it is possible that slicing structure is a good representation for floorpan with mass modules. For a slicing structure, we propose a greedy approach with a relaxed Polish expression and implement our approach based on simulated annealing algorithm. The experimental results show that the proposed approach works efficiently and the result is competent.
Keywords :
VLSI; circuit complexity; greedy algorithms; integrated circuit layout; simulated annealing; VLSI; area cost evaluation; bounding box dimension; chip complexity; dead space constraint; floopanning mass modules; flooplanning computation time; greedy approach; nonslicing structure; perturbation evaluation; placement representation; relaxed Polish expression; simulated annealing algorithm; slicing structure; transistors; Algorithm design and analysis; Benchmark testing; Evolutionary computation; Shape; Simulated annealing; Vegetation; Very large scale integration; Floorplanning; Non-slicing; Relaxed Polish expression; Simulated Annealing; Slicing;
Conference_Titel :
Information Security and Intelligence Control (ISIC), 2012 International Conference on
Conference_Location :
Yunlin
Print_ISBN :
978-1-4673-2587-5
DOI :
10.1109/ISIC.2012.6449696