Title :
Interferometric measurements of nanometric displacements in a Piezoelectric Flextensional Actuator by using the new J1…J5 method
Author :
Marcal, L.A.P. ; Galeti, Jose H. ; Higuti, Ricardo T. ; Kitano, Claudio ; Silva, Emilio C. N.
Author_Institution :
Dept. of Electr. Eng., Univ. Estadual Paulista - UNESP, Ilha Solteira, Brazil
Abstract :
In this work, nanometric displacement amplitudes of a Piezoelectric Flextensional Actuator (PFA) designed using the topology optimization technique and operating in its linear range are measured by using a homodyne Michelson interferometer. A new improved version of the J1...J4 method for optical phase measurements, named J1...J5 method, is presented, which is of easier implementation than the original one. This is a passive phase detection scheme, unaffected by signal fading, source instabilities and changes in visibility. Experimental results using this improvement were compared with those obtained by using the J1...J4, J1...J6(pos) and J1...J6(neg) methods, concluding that the dynamic range is increased while maintaining the sensitivity. Analysis based on the 1/f voltage noise and random fading show the new method is more stable to phase drift than all those methods.
Keywords :
1/f noise; Michelson interferometers; light interferometry; phase measurement; piezoelectric actuators; 1/f voltage noise; J1...J4 method; J1...J5 method; J1...J6 methods; homodyne Michelson interferometer; interferometric measurements; nanometric displacement amplitudes; optical phase measurements; passive phase detection; piezoelectric flextensional actuator; random fading; signal fading; source instabilities; topology optimization technique; Actuators; Displacement measurement; Fading; Laser beams; Measurement by laser beam; Noise; Optical interferometry;
Conference_Titel :
Industry Applications (INDUSCON), 2012 10th IEEE/IAS International Conference on
Conference_Location :
Fortaleza
Print_ISBN :
978-1-4673-2412-0
DOI :
10.1109/INDUSCON.2012.6452451