A statistical assessment of opto-electronic links

Author

Manfredi, Paolo ; Stievano, Igor Simone ; Perrone, G. ; Bardella, Paolo ; Canavero, Flavio G.

Author_Institution

DET - Dept. of Electron. & Telecommun., Politec. di Torino, Turin, Italy

fYear

2012

fDate

21-24 Oct. 2012

Firstpage

61

Lastpage

64

Abstract

This paper addresses the stochastic simulation of high-speed optical interconnects. It provides an effective solution for the inclusion of the effects of process variation or possible unknown device characteristics on the system response. The proposed approach is based on the stochastic collocation method and Lagrange interpolation. The results obtained on the transient analysis of a realistic on-board optical link with uncertain parameters conclude the paper.

Keywords

interpolation; optical interconnections; optical links; optoelectronic devices; statistical analysis; stochastic processes; Lagrange interpolation; high-speed optical interconnects; on-board optical link; opto-electronic links; statistical assessment; stochastic collocation; stochastic simulation; Interpolation; Mathematical model; Optical interconnections; Polynomials; Random variables; Stochastic processes; Circuit modeling; circuit simulation; optical interconnects; stochastic analysis; stochastic collocation; tolerance analysis; uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on

Conference_Location

Tempe, AZ

Print_ISBN

978-1-4673-2539-4

Electronic_ISBN

978-1-4673-2537-0

Type

conf

DOI

10.1109/EPEPS.2012.6457843

Filename

6457843