Title :
A mixed-domain behavioral model´s extraction for digital I/O buffers
Author :
Dghais, Wael ; Cunha, Telmo R. ; Pedro, Jose C.
Author_Institution :
Inst. de Telecomun., Univ. de Aveiro, Aveiro, Portugal
Abstract :
The paper presents a novel extraction procedure based on the frequency domain formulation of the current-charge (I-Q) behavioral model for digital I/O buffers/drivers output admittance followed by a time domain extraction of the predriver´s nonlinear dynamic functions. The large signal model´s functions of the drivers´ output admittance are derived from the bias-dependent scattering, or S-parameters, measurements. This easy and fast extraction method allows the accurate generation of the data-based model from automated and straightforward measurements. The extracted model´s functions are implemented as lookup tables (LUTs) and the behavioral model is validated in typical SI scenario.
Keywords :
S-parameters; buffer circuits; driver circuits; table lookup; I-Q behavioral model; LUT; S-parameter measurement; bias-dependent scattering; current-charge behavioral model; data-based model; digital I-O buffer-driver output admittance; frequency domain formulation; large signal model function; lookup table; mixed-domain behavioral model extraction; predriver nonlinear dynamic function; time domain extraction; Admittance; Computational modeling; Data models; Frequency domain analysis; Integrated circuit modeling; Predictive models; behavioral models extraction; digital I/O buffer; large signal model; signal integrity;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4673-2539-4
Electronic_ISBN :
978-1-4673-2537-0
DOI :
10.1109/EPEPS.2012.6457882
