DocumentCode
594066
Title
Characterizing the impact of conductor surface roughness on CB-CPW behavior via reduced computational complexity
Author
Sain, A. ; Melde, Kathleen L.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Arizona, Tucson, AZ, USA
fYear
2012
fDate
21-24 Oct. 2012
Firstpage
260
Lastpage
263
Abstract
This paper presents a way to include the effects of conductor surface roughness in three-dimensional full wave simulation tools. A comparison of the computational load and attenuation coefficient as a function of the number and area of different surfaces roughened is given.
Keywords
computational complexity; conductors (electric); coplanar waveguides; surface roughness; CB-CPW behavior; attenuation coefficient; computational complexity reduction; computational load; conductor backed coplanar waveguide; conductor surface roughness impact; three-dimensional full wave simulation tools; Attenuation; Computational modeling; Conductors; Rough surfaces; Surface impedance; Surface roughness; Surface waves; autocorrelation function (ACF); conductor backed coplanar waveguide (CB-CPW); conductor loss; interconnect; root mean square height (Hrms); surface roughness; transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location
Tempe, AZ
Print_ISBN
978-1-4673-2539-4
Electronic_ISBN
978-1-4673-2537-0
Type
conf
DOI
10.1109/EPEPS.2012.6457891
Filename
6457891
Link To Document