Title :
On analytic model of multiple vias for high-speed printed circuit board and electric band-gap structures
Author :
Lisha Zhang ; Pan, Gang ; Zhonghai Guo
Author_Institution :
Arizona State Univ., Tempe, AZ, USA
Abstract :
We developed a full-wave formulation to model massive number of vias in high-speed printed circuit board (PCB), through silicon via (TSV) and electric band-gap (EBG) structures. This analytic method employs the equivalent magnetic frill array, Galerkin´s procedure, image theory and Fourier transform to simplify the problem from a 3D configuration into a 2D frame. Based on Bessel´s functions and addition theorem, the final matrix equation is formulated analytically without using any numerical techniques. The new method is purely from the boundary conditions. Consequently, it is simple, versatile, efficient and accurate. Numerical examples demonstrate good agreement between our analytical solution and commercial software (HFSS) for through silicon and PCB vias. The model is also used to study the EBG wall and cavity, for leakage fields.
Keywords :
Bessel functions; Fourier transforms; Galerkin method; integrated circuit modelling; matrix algebra; photonic band gap; printed circuits; three-dimensional integrated circuits; 2D frame; Bessel functions; EBG structures; EBG wall; Fourier transform; Galerkin procedure; HFSS software; PCB vias; TSV model; addition theorem; electric band-gap structures; equivalent magnetic frill array; full-wave formulation; high-speed printed circuit board; image theory; leakage fields; matrix equation; multiple vias analytic model; through silicon via model; Cavity resonators; Insertion loss; Magnetic resonance imaging; Metamaterials; Periodic structures; Silicon; Through-silicon vias;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4673-2539-4
Electronic_ISBN :
978-1-4673-2537-0
DOI :
10.1109/EPEPS.2012.6457904