• DocumentCode
    594336
  • Title

    Statistical analysis of multiconductor cables and interconnects with internal variability and field coupling

  • Author

    Manfredi, Paolo ; Canavero, Flavio G.

  • Author_Institution
    Dipt. di Elettron. e Telecomun., Politec. di Torino, Turin, Italy
  • fYear
    2012
  • fDate
    Oct. 29 2012-Nov. 1 2012
  • Firstpage
    348
  • Lastpage
    351
  • Abstract
    This paper provides an overview of the polynomial chaos (PC) technique applied to the statistical analysis of multi-conductor cables and PCB interconnects with internal variability, like cross-sectional variations, or random field coupling. The methodology is based on the expansion of the random electrical variables onto orthogonal polynomial bases. Accurate polynomial approximations for the random output variables of interest can be obtained through the solution of augmented but deterministic systems of equations, and used for a faster computation of relevant statistical information. Compared to traditional brute-force techniques for statistical analysis, like the Monte Carlo (MC) method, PC offers comparable accuracy and increased efficiency in many practical situations. Application examples demonstrate the strength of the proposed approach.
  • Keywords
    Monte Carlo methods; polynomial approximation; printed circuit interconnections; statistical analysis; MC method; Monte Carlo method; PCB interconnects; brute-force techniques; cross-sectional variations; deterministic systems; internal variability; multiconductor cables; orthogonal polynomial bases; polynomial approximations; random electrical variables; random field coupling; random output variables; statistical analysis; Computational modeling; Crosstalk; Mathematical model; Polynomials; Probability density function; Stochastic processes; Field coupling; polynomial chaos; stochastic analysis; transmission lines; uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2012 42nd European
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-1-4673-2215-7
  • Electronic_ISBN
    978-2-87487-026-2
  • Type

    conf

  • Filename
    6459107