DocumentCode
594474
Title
Design of millimeter-wave probe for diagnosis of human skin
Author
Janssen, N. ; Smulders, P.F.M.
Author_Institution
Fac. of Electr. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
fYear
2012
fDate
Oct. 29 2012-Nov. 1 2012
Firstpage
440
Lastpage
443
Abstract
Millimeter-wave reflectometry is a potentially interesting method to measure varying properties of human-skin tissue. With this method, an open-ended waveguide probe is used, which is pressed against the skin (or bandage), to measure the reflection coefficient in the millimeter-wave frequency band of 40-60 GHz. Thanks to todays low-cost millimeter-wave silicon-based chip technology, this method could possibly be made available for massive usage in home-care situations. However, the measurement conditions in such situations might be ill-defined in the sense that parameters such as probe pressure and probeskin angle are not well controlled. In this paper, two candidate probe types are investigated as regards the sensitivity for probe pressure on the skin, probe-skin angle and layers of bandage between probe and skin. The probes considered are either with or without flange. The unflanged probe turns out to be the most promising candidate provided that careful calibration is possible despite the missing flange.
Keywords
biomedical measurement; calibration; microwave measurement; skin; calibration; frequency 40 GHz to 60 GHz; home-care situations; human skin diagnosis; human-skin tissue properties; low-cost millimeter-wave silicon-based chip technology; millimeter-wave frequency band; millimeter-wave probe design; millimeter-wave reflectometry; open-ended waveguide probe; probe-skin angle; reflection coefficient measurement; Frequency measurement; Humans; Millimeter wave measurements; Plugs; Pressure measurement; Probes; Skin; flanged probe; human skin; millimeter-waves; open-ended rectangular waveguide; reflectometry; unflanged probe;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (EuMC), 2012 42nd European
Conference_Location
Amsterdam
Print_ISBN
978-1-4673-2215-7
Electronic_ISBN
978-2-87487-026-2
Type
conf
Filename
6459262
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