Title :
Reflection phase characterization of the MEMS-based high impedance surface
Author :
Zhou Du ; Ala-Laurinaho, Juha ; Chicherin, D. ; Raisanen, Antti V. ; Sterner, M. ; Oberhammer, Joachim
Author_Institution :
Dept. of Radio Sci. & Eng., Aalto Univ., Aalto, Finland
fDate :
Oct. 29 2012-Nov. 1 2012
Abstract :
The reflection properties of the MEMS-based HIS illuminated from oblique angles of incidence have been characterized numerically, and a quasi-optical measurement setup has been built for experimental characterization. The resonance frequency and the relative bandwidth are slightly increasing with the increase of the angle of incidence. The comparison between the simulated and measured results is discussed.
Keywords :
micromechanical devices; MEMS-based HIS reflection property; MEMS-based high impedance surface; oblique incidence angle; quasioptical measurement setup; reflection phase characterization; resonance frequency; Arrays; Frequency measurement; Impedance; Reflection; Resonant frequency; Surface impedance; Surface waves; Electromagnetic reflection; High-impedance surfaces; Micro-electromechanical devices; Millimeter wave measurement;
Conference_Titel :
Microwave Conference (EuMC), 2012 42nd European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2215-7
Electronic_ISBN :
978-2-87487-026-2
