Title :
Feature analysis for automatic classification of HEp-2 florescence patterns : Computer-Aided Diagnosis of Auto-immune diseases
Author :
Ghosh, Sudip ; Chaudhary, Varun
Author_Institution :
Dept. of Comput. Sci. & Eng., State Univ. of New York (SUNY) at Buffalo, Buffalo, NY, USA
Abstract :
Indirect ImmunoFluorescence (IIF) is currently the recommended method for the detection of antinuclear autoantibodies(ANA). It is an effective technique to reveal the presence of auto immune diseases; however, it is a subjective method and hence dependent on the experience and expertise of the physician. Moreover, inter-observer variability limits the reproducibility of IIF reading. To this end, we propose feature extraction methods for automatic recognition of staining patterns of HEp-2 images (provided as a part of the ICPR 2012 HEp-2 Cells Classification Contest) to develop a Computer-Aided Diagnosis system and support the specialists´ decision. We compare the performances of various individual and combined features and show that a combination of HOG(Histogram of Oriented Gradients), Texture and ROI(Region of Interest) features are best suited for our task achieving an overall accuracy of 91.13% using a Support Vector Machine as classifier.
Keywords :
diseases; feature extraction; fluorescence; image texture; medical image processing; support vector machines; ANA; HEp-2 florescence patterns; HEp-2 images; Histogram of Oriented Gradients; ICPR 2012 HEp-2 cells classification contest; IIF; ROI; antinuclear autoantibodies; auto immune diseases; auto-immune diseases; automatic classification; automatic recognition; computer-aided diagnosis system; feature analysis; feature extraction methods; image texture; indirect immunofluorescence; inter-observer variability limits; region of interest features; staining patterns; support vector machine; Accuracy; Diseases; Feature extraction; Pattern recognition; Robustness; Support vector machines; Training;
Conference_Titel :
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location :
Tsukuba
Print_ISBN :
978-1-4673-2216-4