DocumentCode :
594913
Title :
Does one rotten apple spoil the whole barrel?
Author :
Cheplygina, Veronika ; Tax, David M. J. ; Loog, Marco
Author_Institution :
Pattern Recognition Lab., Delft Univ. of Technol., Delft, Netherlands
fYear :
2012
fDate :
11-15 Nov. 2012
Firstpage :
1156
Lastpage :
1159
Abstract :
Multiple Instance Learning (MIL) is concerned with learning from sets (bags) of objects (instances), where the individual instance labels are ambiguous. In MIL it is often assumed that positive bags contain at least one instance from a so-called concept in instance space. However, there are many MIL problems that do not fit this formulation well, and hence cause traditional MIL algorithms, which focus on the concept, to perform poorly. In this work we show such types of problems and the methods appropriate to deal with either situation. Furthermore, we show that an approach that learns directly from dissimilarities between bags can be adapted to deal with either problem.
Keywords :
learning (artificial intelligence); MIL algorithms; instance space; multiple instance learning; positive bags; supervised learning methods; Bismuth; Kernel; Pattern recognition; Shape; Standards; Training; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location :
Tsukuba
ISSN :
1051-4651
Print_ISBN :
978-1-4673-2216-4
Type :
conf
Filename :
6460342
Link To Document :
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