• DocumentCode
    594927
  • Title

    Discriminative metric: Schatten norm vs. vector norm

  • Author

    Zhenghong Gu ; Ming Shao ; Liangyue Li ; Yun Fu

  • Author_Institution
    SUNY at Buffalo, Buffalo, NY, USA
  • fYear
    2012
  • fDate
    11-15 Nov. 2012
  • Firstpage
    1213
  • Lastpage
    1216
  • Abstract
    The notion of metric is fundamental for the study of pattern recognition and vector 2-norm ||·||2 is one of the most widely used metric, i.e., Euclidean distance. However, there is often the case that the inputs are matrices, e.g., 2D images in face recognition. Since a matrix can take more structure information than its vectorization, it is highly preferable to adopt the matrix representation of the original image rather than a simple vector. In this paper, we first propose a class of discriminative metrics for matrices, i.e., Schatten p-norm, by which we can better explain that with Euclidean metric, why the differences among facial images due to impact factors, e.g., illuminations, are more significant than differences due to identity variations. Second, we propose a novel Principal Component Analysis method based on Schatten 1-norm which can be easily extended to other subspace learning methods. Extensive experiments on Yale B, CMU PIE, ORL and AR databases prove the effectiveness of our method.
  • Keywords
    face recognition; image representation; learning (artificial intelligence); matrix algebra; principal component analysis; visual databases; 2D images; AR databases; CMU PIE databases; Euclidean distance; Euclidean metric; ORL databases; Schatten 1-norm; Schatten p-norm; Yale B; Yale B databases; discriminative metrics; face recognition; matrix representation; pattern recognition; principal component analysis method; structure information; subspace learning methods; vector 2-norm; vector norm; Databases; Face; Face recognition; Lighting; Measurement; Principal component analysis; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2012 21st International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4673-2216-4
  • Type

    conf

  • Filename
    6460356