DocumentCode :
595019
Title :
Illumination suppression for illumination invariant face recognition
Author :
Baradarani, Aryaz ; Wu, Q. M. Jonathan ; Ahmadi, Mahdi
Author_Institution :
Dept. of Electr. Eng., Univ. of Windsor, Windsor, ON, Canada
fYear :
2012
fDate :
11-15 Nov. 2012
Firstpage :
1590
Lastpage :
1593
Abstract :
This paper describes a multiresolution based method for face recognition under illumination variation. The idea of using the double-density dual-tree complex wavelet transform (DD-DTCWT) for illumination invariant face recognition is motivated by the structure of the DD-DTCWT; in addition to the shift-invariance and directionality, the transformation contains more number of wavelets in each level. Assuming that an input image can be considered as a combination of illumination and reflectance, we use a tunable logarithmic function to obtain a representative image. The image is then decomposed into several frequency subbands via DD-DTCWT. Because the illumination mostly lies in the low-frequency part of the images, the high-frequency subbands are thresholded to construct a mask. Principal component analysis (PCA) and the extreme learning machine (ELM) are used for dimensionality reduction and classification, respectively. Experimental results are presented to illustrate the effectiveness of the proposed method.
Keywords :
data reduction; face recognition; image classification; image representation; image resolution; learning (artificial intelligence); principal component analysis; trees (mathematics); wavelet transforms; DD-DTCWT; ELM; PCA; dimension reduction; double density dual tree complex wavelet transform; extreme learning machine; face recognition; frequency subband; illumination suppression; illumination variation; image classification; image decomposition; image representatation; multiresolution based method; principal component analysis; reflectance; shift invariance; tunable logarithmic function; Databases; Discrete wavelet transforms; Face recognition; Lighting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location :
Tsukuba
ISSN :
1051-4651
Print_ISBN :
978-1-4673-2216-4
Type :
conf
Filename :
6460449
Link To Document :
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