DocumentCode :
595026
Title :
Sparse feature fidelity for image quality assessment
Author :
Hua-Wen Chang ; Ming-Hui Wang ; Shu-qing Chen ; Hua Yang ; Zu-jian Huang
Author_Institution :
Coll. of Comput. Sci., Sichuan Univ., Chengdu, China
fYear :
2012
fDate :
11-15 Nov. 2012
Firstpage :
1619
Lastpage :
1622
Abstract :
A quality metric called sparse feature fidelity (SFF) is proposed for full-reference image quality assessment (IQA). It is inspired by the fact that images are transformed into sparse representations by the primary visual cortex which is the most important part of the human visual system (HVS). The proposed method is based on sparse features that are acquired from a set of feature detectors called simple cell matrix which is trained on samples of natural images by a sparse coding algorithm. Then the SFF scores are obtained by a similarity measurement between the features of reference and distorted images. Moreover, two strategies are designed to simulate the properties of the visual perception: visual attention and visual threshold. Experimental results on four image databases show that SFF is more consistent with the subjective evaluations than the leading IQA methods.
Keywords :
computer vision; feature extraction; image coding; image representation; sparse matrices; visual databases; visual perception; HVS; IQA; SFF scores; feature detector; features similarity measurement; human visual system; image database; image distortion; image quality assessment; images transformation; natural image; quality metric; simple cell matrix; sparse coding algorithm; sparse feature acquisition; sparse feature fidelity; sparse representation; visual attention; visual cortex; visual perception; visual threshold; Feature extraction; Image quality; Indexes; PSNR; Sparse matrices; Vectors; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location :
Tsukuba
ISSN :
1051-4651
Print_ISBN :
978-1-4673-2216-4
Type :
conf
Filename :
6460456
Link To Document :
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