Title :
Combining multi-scale dissimilarities for image classification
Author :
Yan Li ; Duin, Robert P. W. ; Loog, Marco
Author_Institution :
Pattern Recognition Lab., Delft Univ. of Technol., Delft, Netherlands
Abstract :
In image classification, multi-scale information is usually combined by concatenating features or selecting scales. Their main drawbacks are that concatenation increases the feature dimensionality by the number of scales and scale selection typically loses the information from other scales. We propose to solve this problem by the dissimilarity representation as it enables to combine various sources of information without increasing the dimensionality of the representation space. Various combining rules are introduced and tested with real-world applications. Our experiments show that combining with dissimilarities from all scales could indeed improve considerably upon the performance of the best single scale and adaptive combining can improve upon straightforward averaging.
Keywords :
feature extraction; image classification; image matching; image representation; dissimilarity representation; feature dimensionality; features scales; information sources; multiscale image classification dissimilarities; multiscale information; real-world applications; representation space dimensionality; selecting scales; Accuracy; Colon; Error analysis; Histograms; Pattern recognition; Training; Vectors;
Conference_Titel :
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location :
Tsukuba
Print_ISBN :
978-1-4673-2216-4