Title :
Set-valued Bayesian inference with probabilistic equivalence
Author :
Le Capitaine, H.
Author_Institution :
LINA, Ecole Polytech. de Nantes, Nantes, France
Abstract :
In this paper, a unified view of the problem of class-selection with Bayesian classifiers is presented. Selecting a subset of classes instead of singleton allows 1) to reduce the error rate and 2) to propose a reduced set to another classifier or an expert. This second step provides additional information, and therefore increases the quality of the result. The proposed framework, based on the evaluation of the probabilistic equivalence, allows to retrieve the class-selective frameworks that have been proposed in the literature. Several experiments show the effectiveness of this generic proposition.
Keywords :
Bayes methods; pattern classification; Bayesian classifiers; class-selection problem; class-selective frameworks; error rate reduction; probabilistic equivalence; set-valued Bayesian inference; Bayesian methods; Error analysis; Error probability; Measurement; Niobium; Pattern recognition; Probabilistic logic;
Conference_Titel :
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location :
Tsukuba
Print_ISBN :
978-1-4673-2216-4