• DocumentCode
    595207
  • Title

    Learning feature weights of symbols, with application to symbol spotting

  • Author

    Nayef, N. ; Afzal, Muhammad Zeshan ; Breuel, Thomas M.

  • Author_Institution
    Tech. Univ. of Kaiserslautern, Kaiserslautern, Germany
  • fYear
    2012
  • fDate
    11-15 Nov. 2012
  • Firstpage
    2371
  • Lastpage
    2374
  • Abstract
    Finding discriminant features is useful for pattern recognition applications. In this work, geometric matching is combined with linear discriminant analysis (LDA) to learn the importance of the features of symbols, and assign weights to these features accordingly. The features are the line segments of the symbols. We use geometric matching within a symbol spotting system to get information on the matching between the line segments of a query symbol and the line segments of the spotted symbols found by the spotting system (both true and false matches). The matching information is used to compute feature vectors for a query symbol. The vectors represent how well the segments of a query are matched to the segments of the true and false matches. Then, LDA is trained on these vectors to get the weights of the line segments of different query symbols. This feature weighting approach is applied in symbol spotting. Using the query weighted features, the spotting system´s precision improves from an average of 71% to an average of 98%, with a speed up factor of 2.1.
  • Keywords
    feature extraction; learning (artificial intelligence); pattern matching; query processing; statistical analysis; symbol manipulation; LDA; discriminant feature extraction; feature vector representation; feature weighting approach; geometric matching; line segment; linear discriminant analysis; pattern recognition; query segment matching; query symbol; query weighted feature; symbol feature weight learning; symbol spotting system; Face; Instruments; Linear discriminant analysis; Pattern recognition; Training; Training data; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2012 21st International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4673-2216-4
  • Type

    conf

  • Filename
    6460642