DocumentCode :
595221
Title :
F-measure optimisation in multi-label classifiers
Author :
Pillai, Ignazio ; Fumera, Giorgio ; Roli, F.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Cagliari, Cagliari, Italy
fYear :
2012
fDate :
11-15 Nov. 2012
Firstpage :
2424
Lastpage :
2427
Abstract :
When a multi-label classifier outputs a real-valued score for each class, a well known design strategy consists of tuning the corresponding decision thresholds by optimising the performance measure of interest on validation data. In this paper we focus on the F-measure, which is widely used in multi-label problems. We derive two properties of the micro-averaged F measure, viewed as a function of the threshold values, which allow its global maximum to be found by an optimisation strategy with an upper bound on computational complexity of O(n2N2), where N and n are respectively the number of classes and of validation samples. So far, only a suboptimal threshold selection rule and a greedy algorithm without any optimality guarantee were known for this task. We then devise a possible optimisation algorithm based on our strategy, and evaluate it on three benchmark, multi-label data sets.
Keywords :
computational complexity; greedy algorithms; optimisation; pattern classification; F-measure optimisation; computational complexity; decision threshold tuning; design strategy; greedy algorithm; micro-averaged F measure; multilabel classifiers; multilabel data sets; multilabel problems; suboptimal threshold selection rule; validation data; Computational efficiency; Optimization; Support vector machines; Testing; Training; Tuning; Upper bound;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location :
Tsukuba
ISSN :
1051-4651
Print_ISBN :
978-1-4673-2216-4
Type :
conf
Filename :
6460656
Link To Document :
بازگشت