• DocumentCode
    595326
  • Title

    A study on semi-supervised dissimilarity representation

  • Author

    Dinh, Cuong V. ; Duin, Robert P. W. ; Loog, Marco

  • Author_Institution
    Pattern Recognition Lab., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2012
  • fDate
    11-15 Nov. 2012
  • Firstpage
    2861
  • Lastpage
    2864
  • Abstract
    In the dissimilarity representation approach, objects are represented by their dissimilarities with respect to a representation set, rather than by features. Up to now, the representation or prototype set has usually been selected from the training data, limiting the different aspects that can be captured, especially when the training data set is small. This paper studies the performance change if the object´s representation is extended by including also test data into the representation set in a semi-supervised setting. Experiments on a set of standard data show that the semi-supervised setting can substantially improve the performance of the dissimilarity based representation especially for the small sample size problem.
  • Keywords
    image representation; learning (artificial intelligence); object recognition; dissimilarity-based representation; object representation; prototype set; representation set; semisupervised dissimilarity representation; semisupervised setting; small sample size problem; standard data; training data; Error analysis; NIST; Pattern recognition; Prototypes; Training; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2012 21st International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4673-2216-4
  • Type

    conf

  • Filename
    6460762