DocumentCode :
595347
Title :
A Linear Max K-min classifier
Author :
Mingzhi Dong ; Liang Yin ; Weihong Deng ; Qiang Wang ; Caixia Yuan ; Jun Guo ; Li Shang ; Liwei Ma
Author_Institution :
Beijing Univ. of Posts & Telecommun., Beijing, China
fYear :
2012
fDate :
11-15 Nov. 2012
Firstpage :
2967
Lastpage :
2971
Abstract :
The mathematical modeling of classifier has been intensively investigated in pattern recognition for decades. Maximin classifier, which conducts optimization based on the perpendicularly closest data point(s) to the decision boundary, has been widely used. However, such method may lead to inferior performance when the boundary data point(s) is significantly influenced by noise. This paper presents a new Linear Max K-min (LMKM) classifier for 2-class classification problems, which offers a general classification solution by considering the K closest data points (K ≥ 1). In other words, given any dataset, the algorithm offers the flexibility to the classification process using the most appropriate number of K boundary points, instead of the the most closet one(s). To tackle the high computational complexity when K or N is relatively large, we propose a new method, which transforms the original objective function into a linear programming problem with 2N constraints which can be solved with high efficiency (where N indicates the number of training samples and K ≤ N). Experimental study shows that the proposed algorithm consistently offers high quality classification results across 18 publicly available 2-class classification datasets, and meanwhile, outperforms Linear Support Vector Machine (SVM) and Logistic Regression (LR) methods.
Keywords :
computational complexity; linear programming; pattern classification; regression analysis; support vector machines; 2-class classification datasets; 2-class classification problems; K closest data points; LMKM classifier; LR methods; SVM; boundary data point; classification process flexibility; classifier mathematical modeling; computational complexity; decision boundary; high quality classification; linear max k-min classifier; linear programming problem; linear support vector machine; logistic regression methods; maximin classifier; pattern recognition; perpendicularly closest data point-based optimization; Computational complexity; Linear programming; Optimization; Pattern recognition; Support vector machines; Testing; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location :
Tsukuba
ISSN :
1051-4651
Print_ISBN :
978-1-4673-2216-4
Type :
conf
Filename :
6460788
Link To Document :
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