DocumentCode
595348
Title
A dual-staged classification-selection approach for automated update of biometric templates
Author
Rattani, Ajita ; Marcialis, Gian Luca ; Granger, E. ; Roli, F.
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Cagliari, Cagliari, Italy
fYear
2012
fDate
11-15 Nov. 2012
Firstpage
2972
Lastpage
2975
Abstract
In the emerging field of adaptive biometrics, systems aim to adapt enrolled templates to variations in samples observed during operations. However, despite numerous advantages, few commercial vendors have adopted auto-update procedures in their products. This is due to limitations associated with existing adaptation schemes. This paper proposes a dual-staged template adaptation scheme that allows to capture `informative´ operational samples with significant variations but without increasing the vulnerability to impostor intrusion. This is achieved through a two staged classification-selection approach driven by the harmonic function and risk minimization technique, over a graph based representation of (enrolment and operational) samples. Experimental results on the DIEE fingerprint data set, explicitly collected for evaluating adaptive biometric systems, demonstrate that the proposed scheme results in 67% reduction in error over the baseline system (without adaptation), outperforming state-of-the-art methods.
Keywords
fingerprint identification; graph theory; image classification; image representation; minimisation; risk analysis; DIEE fingerprint data set; adaptive biometric system evaluation; automated biometric template update; autoupdate procedure; dual-staged classification-selection approach; dual-staged template adaptation scheme; graph-based representation; harmonic function; informative operational samples; intrusion vulnerability; risk minimization; Adaptive systems; Biometrics (access control); Error analysis; Harmonic analysis; Noise measurement; Probabilistic logic; Risk management;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location
Tsukuba
ISSN
1051-4651
Print_ISBN
978-1-4673-2216-4
Type
conf
Filename
6460789
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