Title :
Classification performance using ´RF-DNA´ fingerprinting of ultra-wideband noise waveforms
Author :
Lukacs, M. ; Collins, P. ; Temple, M.
Author_Institution :
Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
Abstract :
Device classification is important in many applications such as industrial quality control, through-wall imaging and network security. A novel approach has been proposed to use a digital noise radar (DNR) to actively interrogate microwave devices and classify defective units using `radio frequency distinct native attribute (RF-DNA)´ fingerprinting and various classifier algorithms. RF-DNA has previously demonstrated `serial number´ discrimination of numerous passive radio frequency signals, achieving classification accuracies above 80% using multiple discriminant analysis/maximum likelihood (MDA/ML) and generalised relevance learning vector quantisation-improved (GRLVQI) classifiers. It has also demonstrated above 80% classification of limited active interrogation responses with a DNR signal using these classifiers. The performance capabilities of the two different classifiers, MDA/ML and GRLVQI, on RF-DNA fingerprints produced from the ultra-wideband noise radar correlation response is expanded.
Keywords :
maximum likelihood estimation; radar signal processing; signal classification; vector quantisation; DNR; DNR signal; GRLVQI classifiers; MDA/ML classifiers; RF-DNA fingerprinting; UWB noise radar correlation response; classification accuracy; defective unit classification; device classification performance; digital noise radar; generalised relevance learning vector quantisation-improved classifiers; industrial quality controls; limited active interrogation response; microwave devices; multiple discriminant analysis-maximum likelihood classifiers; network security; passive radio frequency signals; radio frequency distinct native attribute fingerprinting; serial number discrimination; through-wall imaging; ultrawideband noise radar correlation response; ultrawideband noise waveforms;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2015.0051