DocumentCode
596168
Title
Pattern-Based Model Transformation Using QVT
Author
Sunuk Park ; Dae-Kyoo Kim ; Sooyong Park
Author_Institution
Dept. of Comp. Sci. & Eng., Sogang Univ., Seoul, South Korea
Volume
1
fYear
2012
fDate
4-7 Dec. 2012
Firstpage
472
Lastpage
481
Abstract
A design pattern addresses a recurring design problem by providing a proven solution for reuse in software development. However, due to the informal nature of prevailing pattern descriptions, it is difficult to reuse design patterns in practice. There has been much work on tool support for pattern reuse. However, the existing work focuses on only the solution domain of a pattern, leaving largely the problem domain unaddressed which is an important aspect in determining pattern applicability. Also, the existing work uses non-standardized techniques, which makes it difficult to adopt. In this work, we present a novel approach for applying design patterns using Query/View/Transformation (QVT), a de-facto standard for model transformation. In the approach, we make use of both the problem domain and solution domain of a design pattern for checking pattern applicability and verifying pattern conformance. The domains are defined at the metamodel level and mapped each other for a base to define QVT transformation. We demonstrate the approach using the Visitor design pattern applied to an open source drawing tool.
Keywords
object-oriented programming; program verification; software reusability; QVT; Visitor design pattern; design pattern reusing; metamodel level; nonstandardized technique; open source drawing tool; pattern applicability checking; pattern conformance verification; pattern description; pattern-based model transformation; query/view/transformation; recurring design problem; software development; Abstracts; Concrete; Mathematical model; Metamodeling; Standards; Transforms; Unified modeling language; Design Patterns; Model Transformation; QVT;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering Conference (APSEC), 2012 19th Asia-Pacific
Conference_Location
Hong Kong
ISSN
1530-1362
Print_ISBN
978-1-4673-4930-7
Type
conf
DOI
10.1109/APSEC.2012.44
Filename
6462698
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