Title :
SEU simulation by fault injection in PSoC device: Preliminary results
Author :
Mansour, Wassim ; Velazco, Raoul ; El Falou, Wassim ; Ziade, Haissam ; Ayoubi, Rafic
Author_Institution :
TIMA Labs., Grenoble, France
Abstract :
In this paper the consequences of SEU (Single Event Upset) faults on System on Chip devices (SOC) are studied. A PSOC microcontroller CY8C27643 manufactured by Cypress was chosen as a test vehicle. Fault injection sessions were performed using the so-called (Code Emulated Upset) approach in two different HW/SW environments. Obtained results put in evidence the potentially critical consequences of some of the faults occurring in the digital blocks when a matrix multiplication benchmark is being executed.
Keywords :
hardware-software codesign; matrix multiplication; microprocessor chips; programmable circuits; system-on-chip; HW/SW environment; PSOC microcontroller CY8C27643; PSoC device; SEU simulation; code emulated upset; fault injection; matrix multiplication; single event upset fault; system-on-chip device; Benchmark testing; Circuit faults; Field programmable gate arrays; Microcontrollers; Registers; Single event upset; System-on-a-chip; Code Emulated Upset (CEU); PSOC; Single Event Effects (SEU); System On Chip (SOC); fault injection;
Conference_Titel :
Advances in Computational Tools for Engineering Applications (ACTEA), 2012 2nd International Conference on
Conference_Location :
Beirut
Print_ISBN :
978-1-4673-2488-5
DOI :
10.1109/ICTEA.2012.6462894
