DocumentCode
596753
Title
Design to phase measurement profilometry on grating projection system
Author
Jie Xu ; Jun Xu ; Xiaoyang Yu
Author_Institution
Heilongjiang Inst. of Sci. & Technol., Harbin Univ. of Sci. & Technol., Harbin, China
fYear
2012
fDate
18-20 Oct. 2012
Firstpage
1069
Lastpage
1071
Abstract
Phase measuring profilometry is an important measurement method of the optical 3D measurement system, in which the projector is used in the grating fringe projection. Then there are some shortcomings to the projector used in the projection process. In this paper, the physical grating equipment based on the design of a projection is designed and structural parameter to filming machine is optimized. It indicated that the new method is effective method to overcome the projector appear to improve the measurement accuracy.
Keywords
diffraction gratings; optical projectors; optical variables measurement; phase measurement; filming machine; grating projection system; optical 3D measurement system; phase measurement profilometry design; physical grating equipment; structural parameter; Accuracy; Cameras; Gratings; Lenses; Optical imaging; Optical variables measurement; Phase measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Computational Intelligence (ICACI), 2012 IEEE Fifth International Conference on
Conference_Location
Nanjing
Print_ISBN
978-1-4673-1743-6
Type
conf
DOI
10.1109/ICACI.2012.6463336
Filename
6463336
Link To Document