Title :
Testing wireless transceivers´ RF front-ends utilizing defect-oriented BIST techniques
Author :
Dermetzoglou, L. ; Liaperdos, John ; Arapoyanni, Angela ; Tsiatouhas, Y.
Author_Institution :
Dept. of Inf. & Telecommun., Univ. of Athens, Athens, Greece
Abstract :
In modern nanotechnologies, the testing of embedded wireless transceivers´ RF front-ends is a great concern. The test technique presented in this work is based on dedicated built-in self test (BIST) structures for each building block of the transceiver. These BIST circuits utilize defect-oriented test techniques. Experimental results on a CMOS transceiver design are discussed to accentuate the efficiency of the proposed scheme.
Keywords :
CMOS integrated circuits; built-in self test; embedded systems; integrated circuit testing; nanotechnology; transceivers; BIST circuits; BIST structures; CMOS transceiver design; building block; dedicated built-in self test structures; defect-oriented BIST techniques; defect-oriented test techniques; embedded wireless transceivers RF front-ends; nanotechnology; testing wireless transceivers; Built-in self-test; Circuit faults; Mixers; Radio frequency; Receivers; Transceivers;
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4673-1261-5
Electronic_ISBN :
978-1-4673-1259-2
DOI :
10.1109/ICECS.2012.6463501
