• DocumentCode
    596840
  • Title

    A 1.1 V 82.3dB audio ΔΣ ADC using asynchronous SAR type quantizer

  • Author

    Young-min Park ; Tae-In Kwon ; Kang-Il Cho ; Yong-Sik Kwak ; Gil-Cho Ahn ; Chang-Seob Shin ; Myung-Jin Lee ; Seung-Bin You ; Ho-Jin Park

  • Author_Institution
    Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
  • fYear
    2012
  • fDate
    9-12 Dec. 2012
  • Firstpage
    637
  • Lastpage
    640
  • Abstract
    A switched-capacitor second-order audio ΔΣ analog-to-digital converter (ADC) is presented. The proposed ΔΣ ADC employs low-distortion input feed-forward architecture to relax the linearity requirement of the integrators. A 4-bit asynchronous successive approximation register (SAR) type internal quantizer is used for power efficient design by incorporating the analog adder with the quantizer. A tree-structured dynamic element matching (DEM) technique is employed to reduce the distortion resulted from the capacitor mismatch in the feedback digital-to-analog converter (DAC). The prototype ΔΣ ADC implemented in a 45nm CMOS process achieves 85.4 dB peak signal-to-noise ratio (SNR), 82.3 dB peak signal-to-noise and distortion ratio (SNDR) and 98.1 dB dynamic range (DR) for a signal bandwidth of 24 kHz while consuming 517.4 μW at 1.1 V supply voltage.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; audio equipment; delta-sigma modulation; switched capacitor networks; CMOS process; analog-digital converter; asynchronous SAR type quantizer; asynchronous successive approximation register; bandwidth 24 kHz; capacitor mismatch; feed forward architecture; feedback digital-analog converter; internal quantizer; power 517.4 muW; second order audio delta-sigma ADC; size 45 nm; switched capacitor; tree structured dynamic element matching; voltage 1.1 V; Adders; Capacitors; Clocks; Linearity; Modulation; Signal to noise ratio; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on
  • Conference_Location
    Seville
  • Print_ISBN
    978-1-4673-1261-5
  • Electronic_ISBN
    978-1-4673-1259-2
  • Type

    conf

  • DOI
    10.1109/ICECS.2012.6463555
  • Filename
    6463555