DocumentCode :
596996
Title :
Reducing bit flipping problems in SRAM physical unclonable functions for chip identification
Author :
Eiroa, Susana ; Castro, Jose ; Martinez-Rodriguez, Macarena Cristina ; Tena, Erica ; Brox, Piedad ; Baturone, Iluminada
Author_Institution :
Dept. Electron. & Electromagn., Univ. of Seville, Seville, Spain
fYear :
2012
fDate :
9-12 Dec. 2012
Firstpage :
392
Lastpage :
395
Abstract :
Physical Unclonable functions (PUFs) have appeared as a promising solution to provide security in hardware. SRAM PUFs offer the advantage, over other PUF constructions, of reusing resources (memories) that already exist in many designs. However, their intrinsic noisy nature produces the so called bit flipping effect, which is a problem in circuit identification and secret key generation. The approaches reported to reduce this effect usually resort to the use of pre- and post-processing steps (such as Fuzzy Extractor structures combined with Error Correcting Codes), which increase the complexity of the system. This paper proposes a pre-processing step that reduces bit flipping problems without increasing the hardware complexity. The proposal has been verified experimentally with 90-nm SRAMs included in digital application specific integrated circuits (ASICs).
Keywords :
SRAM chips; application specific integrated circuits; ASIC; PUF constructions; SRAM physical unclonable functions; bit flipping problem reduction; chip identification; digital application specific integrated circuits; error correcting codes; fuzzy extractor structures; hardware complexity; hardware security; intrinsic noisy nature; postprocessing steps; preprocessing steps; secret key generation; size 90 nm; Application specific integrated circuits; Hardware; Power supplies; Random access memory; Reliability; Temperature measurement; IC identification; SRAM PUFs; hardware security;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4673-1261-5
Electronic_ISBN :
978-1-4673-1259-2
Type :
conf
DOI :
10.1109/ICECS.2012.6463720
Filename :
6463720
Link To Document :
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