Title :
Protective circuitry developments related to MOSFET protection setup to the occurrence of electrostatic discharge phenomenon
Author :
Bicleanu, P. ; Nicuta, A. ; Bargan, L. ; Salceanu, Andrei ; Postolache, Octavian
Author_Institution :
Fac. of Electr. Eng., Gheorghe Asachi Tech. Univ. of Iasi, Iasi, Romania
Abstract :
Dealing with microelectronic industry, the Electrostatic Discharge has a significant importance regarding the failures related to the solid state devices. The paper is focused on software applications concerning the effects of electrostatic discharges on MOSFET integrated circuitry, using a dedicated computational program. We considered in our approach, some different electronic components with electrostatic discharge protective properties. Our research is useful in electronic domain to select the most adequate electronic equipments, in order to treat and reduce the effects of electrostatic discharges.
Keywords :
MOSFET; electrostatic discharge; integrated circuits; protection; MOSFET integrated circuitry; MOSFET protection setup; electronic components; electronic domain; electronic equipments; electrostatic discharge protective properties; microelectronic industry; protective circuitry developments; software applications; solid state devices; Electrostatic discharges; Integrated circuit modeling; Power transmission lines; Semiconductor diodes; Testing; Transmission line measurements; TLPsystem; electronic equipment; electrostatic discharge; integrated circuit;
Conference_Titel :
Electrical and Power Engineering (EPE), 2012 International Conference and Exposition on
Conference_Location :
Iasi
Print_ISBN :
978-1-4673-1173-1
DOI :
10.1109/ICEPE.2012.6463845
