DocumentCode :
5973
Title :
Continuation-Based Pull-In and Lift-Off Simulation Algorithms for Microelectromechanical Devices
Author :
Zheng Zhang ; Kamon, M. ; Daniel, Luca
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume :
23
Issue :
5
fYear :
2014
fDate :
Oct. 2014
Firstpage :
1084
Lastpage :
1093
Abstract :
The voltages at which microelectromechanical actuators and sensors become unstable, known as pull-in and lift-off voltages, are critical parameters in microelectromechanical systems (MEMS) design. The state-of-the-art MEMS simulators compute these parameters by simply sweeping the voltage, leading to either excessively large computational cost or to convergence failure near the pull-in or lift-off points. This paper proposes to simulate the behavior at pull-in and lift-off employing two continuation-based algorithms. The first algorithm appropriately adapts standard continuation methods, providing a complete set of static solutions. The second algorithm uses continuation to trace two kinds of curves and generates the sweep-up or sweep-down curves, which can provide more intuition for MEMS designers. The algorithms presented in this paper are robust and suitable for general-purpose industrial MEMS designs. Our algorithms have been implemented in a commercial MEMS/integrated circuits codesign tool, and their effectiveness is validated by comparisons against measurement data and the commercial finite-element/boundary-element (FEM/BEM) solver CoventorWare.
Keywords :
boundary-elements methods; finite element analysis; micromechanical devices; CoventorWare finite-element-boundary-element solver; MEMS simulators; continuation based lift-off simulation algorithm; continuation based pull-in simulation algorithm; general purpose industrial MEMS designs; integrated circuits codesign tool; microelectromechanical devices; Algorithm design and analysis; Computational modeling; Mathematical model; Micromechanical devices; Solid modeling; Stability analysis; Standards; MEMS CAD; continuation; continuation.; lift-off; pull-in;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2014.2304967
Filename :
6748897
Link To Document :
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