DocumentCode
597300
Title
Crystal growth of the (Ga1−x Inx )2 Se3 , 0.32≤x≤0.42 phase and investigation of physical properties of obtained single crystals
Author
Ivashchenko, I.A. ; Halyan, V.V. ; Danylyuk, I.V. ; Pankevuch, V.Z. ; Davydyuk, G.Ye. ; Olekseyuk, I.D.
Author_Institution
Department of Inorganic and Physical Chemistry, Lesya Ukrainka Volyn National University, Lutsk, Ukraine
fYear
2012
fDate
3-7 Sept. 2012
Firstpage
33
Lastpage
34
Abstract
The phase diagram of the Ga2 Se3 -In2 Se3 system as investigated by differential-thermal analysis (DTA) and X-ray diffraction (XRD) method. The single crystals from the area of existence of the γ2 phase with the compositions (Ga0.6 In0.4 )2 Se3 and (Ga0.594 In0.396 Er0.01 )2 Se3 were grown by a vertical Bridgman method. Absorption spectra of the grown crystals were studied. The estimated optical band gap is 1.95±0.01 eV. The resistance of the single crystals of (Ga0.6 In0.4 )2 Se3 (R = 500 MΩ) and (Ga0.594 In0.396 Er0.01 )2 Se3 (R = 210 MΩ) was measured.
Keywords
Absorption; Annealing; Crystals; Erbium; Photonic band gap; Resistance; X-ray scattering; absorption spectra; band gap; phase diagram; resistance; semiconductor; single crystal;
fLanguage
English
Publisher
ieee
Conference_Titel
Oxide Materials for Electronic Engineering (OMEE), 2012 IEEE International Conference on
Conference_Location
Lviv, Ukraine
Print_ISBN
978-1-4673-4491-3
Type
conf
DOI
10.1109/OMEE.2012.6464856
Filename
6464856
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