DocumentCode
597383
Title
Stochastic kriging for conditional value-at-risk and its sensitivities
Author
Xi Chen ; Nelson, Barry L. ; Kyoung-Kuk Kim
Author_Institution
Dept. of Ind. Eng. & Manage. Sci., Northwestern Univ., Evanston, IL, USA
fYear
2012
fDate
9-12 Dec. 2012
Firstpage
1
Lastpage
12
Abstract
Measuring risks in asset portfolios has been one of the central topics in the financial industry. Since the introduction of coherent risk measures, studies on risk measurement have flourished and measures beyond value-at-risk, such as expected shortfall, have been adopted by academics and practitioners. However, the complexity of financial products makes it very difficult and time consuming to perform the numerical tasks necessary to compute these risk measures. In this paper, we introduce a stochastic kriging metamodel-based method for efficient estimation of risks and their sensitivities. In particular, this method uses gradient estimators of assets in a portfolio and gives the best linear unbiased predictor of the risk sensitivities with minimum mean squared error. Numerical comparisons of the proposed method with two other stochastic kriging based approaches demonstrate the promising role that the proposed method can play in the estimation of financial risk.
Keywords
financial management; gradient methods; mean square error methods; risk analysis; statistical analysis; stochastic processes; asset portfolio; conditional value-at-risk; expected shortfall; financial industry; financial risk estimation; gradient estimator; linear unbiased predictor; minimum mean squared error; numerical comparisons; numerical task; risk measurement; risk sensitivity; stochastic kriging metamodel-based method; Approximation methods; Covariance matrix; Estimation; Portfolios; Reactive power; Sensitivity; Stochastic processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference (WSC), Proceedings of the 2012 Winter
Conference_Location
Berlin
ISSN
0891-7736
Print_ISBN
978-1-4673-4779-2
Electronic_ISBN
0891-7736
Type
conf
DOI
10.1109/WSC.2012.6465096
Filename
6465096
Link To Document