• DocumentCode
    597406
  • Title

    Optimization model selection for simulation-based approximate dynamic programming approaches in semiconductor manufacturing operations

  • Author

    Xiaoting Chen ; Fernandez, Eduardo ; Kelton, W. David

  • Author_Institution
    Sch. of Electron. & Comput. Syst., Univ. of Cincinnati, Cincinnati, OH, USA
  • fYear
    2012
  • fDate
    9-12 Dec. 2012
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    Guided by Little´s law, decision and control models for operations in reentrant line manufacturing (RLM) systems are commonly set up to minimize the total work-in-process (WIP), which in turn indirectly minimizes cycle time (CT). By viewing the problem fundamentally differently, we re-formulate it as one that seeks to select the best cost function leading to optimal cycle times. We present the details and results of an extended simulation study, based on a benchmark problem, using a simulation-based approximate dynamic programming method, with a newly proposed extended actor-critic architecture. Our results support the idea that a Markov decision process modeling approach can be used as a flexible platform to explore different cost formulations, leading to a selection of an optimal cost and model to optimize cycle time directly.
  • Keywords
    Markov processes; dynamic programming; manufacturing systems; semiconductor industry; simulation; Little law; Markov decision process modeling approach; benchmark problem; control models; decision models; extended actor-critic architecture; optimal cycle times; optimization model selection; reentrant line manufacturing systems; semiconductor manufacturing operations; simulation-based approximate dynamic programming approaches; simulation-based approximate dynamic programming method; work-in-process; Computational modeling; Cost function; Dynamic programming; Markov processes; Measurement; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), Proceedings of the 2012 Winter
  • Conference_Location
    Berlin
  • ISSN
    0891-7736
  • Print_ISBN
    978-1-4673-4779-2
  • Electronic_ISBN
    0891-7736
  • Type

    conf

  • DOI
    10.1109/WSC.2012.6465138
  • Filename
    6465138