DocumentCode :
597558
Title :
Investigation of rock-salt CrTe thin film grown by molecular beam epitaxy toward half-metal
Author :
Lu Hui ; Teo Kie Leong
Author_Institution :
Electr. & Comput. Eng. Dept., Nat. Univ. of Singapore, Singapore, Singapore
fYear :
2013
fDate :
2-4 Jan. 2013
Firstpage :
56
Lastpage :
58
Abstract :
We report the growth of rock-salt CrTe thin film on MgO substrate by molecular-beam epitaxy (MBE). Our high-resolution transmission electron microscopy (HRTEM) results show that a metastable rock-salt (RS) CrTe film can be achieved in a crystalline phase with thickness of 50 nm. The temperature dependence of remanent magnetization shows two ferromagnetic transition temperatures at 165 K and > 400 K. The occurrence of two transition temperatures is probably due to the existence of multi-axial anisotropy in RS CrTe. A new magnetic phase of CrTe is confirmed to exist in the sample by studying the hysteresis loop at 400 K.
Keywords :
chromium compounds; molecular beam epitaxial growth; semiconductor thin films; transmission electron microscopy; CrTe; HRTEM; MBE; MgO; crystalline phase; high-resolution transmission electron microscopy; metastable rock-salt film; molecular beam epitaxy; multi-axial anisotropy; remanent magnetization; rock-salt thin film; size 50 nm; temperature 165 K; temperature 400 K; Magnetic hysteresis; Magnetization; Molecular beam epitaxial growth; Substrates; Temperature dependence; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2013 IEEE 5th International
Conference_Location :
Singapore
ISSN :
2159-3523
Print_ISBN :
978-1-4673-4840-9
Electronic_ISBN :
2159-3523
Type :
conf
DOI :
10.1109/INEC.2013.6465952
Filename :
6465952
Link To Document :
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