DocumentCode
597717
Title
A method to make SoC verification independent of pin multiplexing change
Author
Ghosh, Prosenjit ; Hira, P.S. ; Garg, Shelly
Author_Institution
Networking & Multimedia Group, India Design Center, India
fYear
2013
fDate
4-6 Jan. 2013
Firstpage
1
Lastpage
6
Abstract
As the size and complexity of System-On-Chip (SoC) design is increasing rapidly, a portable and structured verification (testbench) environment is desired to cope with time to market. The pin multiplexing complexity i.e number of functions/peripherals (IPs) multiplexed on a single I/O pad is growing rapidly as many functions/IPs are getting integrated into single device. There are SoCs where four or more functions/peripherals are multiplexed on a single chip pad as the application usage of each IP/function is mutually exclusive in nature. This pin multiplexing option changes across SoCs and also in between different releases for the same SoC. Over time, it is being observed that this I/O pad multiplexing becomes major bottleneck in reusing/porting/creating testbench and verification environment across SoCs and releases. In this paper, we are proposing a new testbench layer (i.e “Function mapping”) in between the device under verification(DUV) and the various testbench components (e.g testbench drivers/ testbench monitors/bus functional models). This new layer reduces the overall verification cycle time significantly (approx 20% to 50%). We will discuss this layer implementation and usage in detail and results of the proposed approach.
Keywords
formal verification; logic circuits; logic design; logic testing; peripheral interfaces; system-on-chip; I/O pad multiplexing; IP; SoC verification; bus functional model; device under verification; function mapping; peripheral; pin multiplexing change; pin multiplexing complexity; pin multiplexing option; portable verification; single I/O pad; structured verification; system-on-chip design complexity; testbench component; testbench creation; testbench driver; testbench environment; testbench monitor; testbench porting; testbench reuse; time to market; verification cycle time; verification environment; Computer architecture; Computers; Hardware design languages; Informatics; Monitoring; Multiplexing; System-on-a-chip; Driver; IP (intelectual property); Monitor; SoC; System Verilog; Verification; bus functional model(BFM); pin multiplexing sheet (pinmux); testbench architecture;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Communication and Informatics (ICCCI), 2013 International Conference on
Conference_Location
Coimbatore
Print_ISBN
978-1-4673-2906-4
Type
conf
DOI
10.1109/ICCCI.2013.6466149
Filename
6466149
Link To Document