DocumentCode :
598262
Title :
Unbiased risk estimation for sparse analysis regularization
Author :
Deledalle, Charles-Alban ; Vaiter, S. ; Peyre, Gabriel ; Fadili, J. ; Dossal, C.
fYear :
2012
fDate :
Sept. 30 2012-Oct. 3 2012
Firstpage :
3053
Lastpage :
3056
Abstract :
In this paper, we propose a rigorous derivation of the expression of the projected Generalized Stein Unbiased Risk Estimator (GSURE) for the estimation of the (projected) risk associated to regularized ill-posed linear inverse problems using sparsity-promoting ℓ1 penalty. The projected GSURE is an unbiased estimator of the recovery risk on the vector projected on the orthogonal of the degradation operator kernel. Our framework can handle many well-known regularizations including sparse synthesis- (e.g. wavelet) and analysis-type priors (e.g. total variation). A distinctive novelty of this work is that, unlike previously proposed ℓ1 risk estimators, we have a closed-form expression that can be implemented efficiently once the solution of the inverse problem is computed. To support our claims, numerical examples on ill-posed inverse problems with analysis and synthesis regularizations are reported where our GSURE estimates are used to tune the regularization parameter.
Keywords :
image processing; inverse problems; risk analysis; sparse matrices; vectors; wavelet transforms; analysis-type priors; closed-form expression; degradation operator kernel orthogonal; projected GSURE; projected generalized Stein unbiased risk estimator expression; recovery risk unbiased estimator; regularization parameter analysis; regularization parameter synthesis; regularized ill-posed linear inverse problems; sparse analysis regularization; sparse synthesis; sparsity-promoting ℓ1penalty; total variation; vector projection; wavelet synthesis; Closed-form solutions; Deconvolution; Degradation; Estimation; Noise; Sensitivity; GSURE; Sparsity; analysis regularization; inverse problems; risk estimator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location :
Orlando, FL
ISSN :
1522-4880
Print_ISBN :
978-1-4673-2534-9
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2012.6467544
Filename :
6467544
Link To Document :
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