DocumentCode :
598352
Title :
A closed-loop switched-capacitor readout circuit for Micromachined capacitive accelerometer
Author :
Rui Chen ; You Lu ; Wei Lang ; Peiyuan Wan ; Chi Zhang ; Ping Lin ; Weiguo Su ; Wei Zhang
Author_Institution :
Beijing Embedded Syst. Key Lab., Beijing Univ. of Technol., Beijing, China
fYear :
2012
fDate :
Oct. 29 2012-Nov. 1 2012
Firstpage :
1
Lastpage :
3
Abstract :
This paper presents an interface readout circuit for Micromachined capacitive accelerometer. An analog closed-loop switched-capacitor (SC) interface circuit is proposed to achieve high linearity and large dynamic range of the sensor. Correlated double sampling (CDS) technique is used in SC circuits to minimize offset and 1/f noise of the amplifier. The stability of the close-loop system is improved by adding a proportional-derivative (PD) controller. A 2nd-order single-bit Σ-Δ modulator is used to digitize the output of the SC loop. The post-simulation results indicate that the sensitivity of the system is 900mV/g and the 2.9μV/√ Hz noise floor. The non-linearity is less than 0.7% with full scale acceleration of ±1.8 g. The nominal supply voltage is 5V and the signal bandwidth ranges from DC up to 200Hz. The active area of the SC readout circuit is 2mm2 in a 0.35μm CMOS process.
Keywords :
1/f noise; CMOS integrated circuits; PD control; accelerometers; capacitive sensors; closed loop systems; micromachining; microsensors; sigma-delta modulation; switched capacitor networks; 1/f noise; 2nd-order single-bit Σ-Δ modulator; CMOS process; SC circuits; SC loop; analog closed-loop switched-capacitor interface circuit; bandwidth 0 Hz to 200 Hz; correlated double sampling technique; interface readout circuit; micromachined capacitive accelerometer; nominal supply voltage; proportional-derivative controller; size 0.35 mum; voltage 5 V; Accelerometers; Application specific integrated circuits; Circuit stability; Linearity; Modulation; Noise; PD control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
Type :
conf
DOI :
10.1109/ICSICT.2012.6467722
Filename :
6467722
Link To Document :
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