DocumentCode :
598365
Title :
Performance of pentacene thin film transistors fabricated with different deposition speeds
Author :
Hui-Kun Yao ; Lei Sun ; You-Feng Geng ; Yu-Qian Xia ; Yi-Jiao Wang ; Zhi-Yuan Lun ; Tai-Huan Wang ; Wen-Tong Zhu ; De-Dong Han
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
fYear :
2012
fDate :
Oct. 29 2012-Nov. 1 2012
Firstpage :
1
Lastpage :
3
Abstract :
Bottom-gated pentacene thin film transistors have been fabricated with different deposition speeds and the devices´ current-voltage properties are reported. The pentacene films are formed through evaporation in low pressure. The characteristics of the surface morphologies and microstructures of the samples were studied respectively. We also studied the transfer characteristics and output properties. Pentacene-TFTs can exhibit excellent electrical properties while Vg changes from 0 to -70V, and Ion/Ioff ratio is larger than 104 and OFF-state current is smaller than -1.3×10-10A as Vd=-100V.
Keywords :
surface morphology; thin film transistors; vacuum deposition; current-voltage properties; deposition speeds; evaporation; pentacene thin film transistors; surface morphology; voltage -70 V to 0 V; Films; Logic gates; Organic thin film transistors; Pentacene; Surface topography; Surface treatment; Pentacene-TFT; electrical properties; evaporation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
Type :
conf
DOI :
10.1109/ICSICT.2012.6467745
Filename :
6467745
Link To Document :
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