Title :
DRAM operating states and burn in
Author :
Ellis, W. ; Yip, G. ; Hong, Jonggi
Author_Institution :
Rambus Inc., Sunnyvale, CA, USA
Abstract :
Observation of system level DRAM operations can provide insights for developing improved reliability screens such as burn-in. We instrumented a dual rank 4GB RDIMM to probe command bus traffic from the memory controller to the DRAMs on a server mother board. Internal DRAM operating states are derived by analyzing the command bus traffic. Analysis showed that when the controller uses an open page policy with bank interleaving, the active idle state can become the dominant bias configuration in activated arrays. This result can be applied to the development of an efficient burn in stress.
Keywords :
DRAM chips; traffic; dominant bias configuration; dual rank 4GB RDIMM; memory controller; probe command bus traffic; reliability screens; system level DRAM operations; Clocks; Instruments; Junctions; Random access memory; Streaming media; Stress; Timing;
Conference_Titel :
Integrated Reliability Workshop Final Report (IRW), 2012 IEEE International
Conference_Location :
South Lake Tahoe, CA
Print_ISBN :
978-1-4673-2749-7
DOI :
10.1109/IIRW.2012.6468941
