Title :
A multi-channel charge readout IC with offset calibration for X-ray industrial inspection
Author :
Xu Wang ; Hongyan Yang ; Ying Yuan ; Wuchen Wu
Author_Institution :
Syst. Lab., Beijing Univ. of Technol., Beijing, China
Abstract :
A multi-channel charge readout integrated circuit (IC) which converts detector charge to analog voltage with offset calibration for X-ray industrial inspection is described. The charge readout IC provides 64 channels of circuit having a max dynamic range of 14 bit and is comprised of charge amplifier gain control, timing generator, shift register chain, charge amplifier array, sample/hold (S/H) stage amplifier and driver etc. It was fabricated using 0.8 um standard CMOS process, and occupies a die area of 3.1 mm × 10.9 mm. It operates at 4 MHz, consumes 45 mW from 5 V supply and 3.5 V as reference, and has a demonstrated output noise performance of 600 uVrms on 0.5 pF of charge amplifier gain capacitance and 33 pF of photodiode (PD) terminal capacitance.
Keywords :
CMOS integrated circuits; X-ray applications; amplifiers; calibration; inspection; integrated circuits; X-ray industrial inspection; charge amplifier array; charge amplifier gain capacitance; charge amplifier gain control; max dynamic range; multichannel charge readout IC; multichannel charge readout integrated circuit; offset calibration; photodiode terminal capacitance; power 45 mW; sample-hold stage amplifier; shift register chain; standard CMOS process; timing generator; voltage 3.5 V; voltage 5 V; Calibration; Capacitance; Detectors; Inspection; Integrated circuits; Noise; X-ray imaging; Dynamic range; Multi-channel charge readout IC; Offset calibration; X-ray industrial inspection;
Conference_Titel :
Image and Signal Processing (CISP), 2012 5th International Congress on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4673-0965-3
DOI :
10.1109/CISP.2012.6469897
