Title :
Particle swarm optimization for the identification of worst case test vectors of total-dose induced leakage current failures in ASICs
Author :
Abdel-Aziz, M.M. ; Abdel-Aziz, H.A. ; Abou-Auf, A.A. ; Wassal, A.G.
Author_Institution :
Electronics Engineering Dept., American University in Cairo, AUC Avenue, P.O. Box 74, New Cairo, 11835, Egypt
Abstract :
We develop a methodology for identifying worst-case test vectors necessary to detect leakage current failures in standard-cell based ASIC devices exposed to a total ionizing dose. We developed a novel search methodology based on the Particle Swarm Optimization technique.
Keywords :
CMOS; PSO; Particle Swarm Optimization; leakage current; test vectors; total dose; worst-case;
Conference_Titel :
Microelectronics (ICM), 2012 24th International Conference on
Conference_Location :
Algiers, Algeria
Print_ISBN :
978-1-4673-5289-5
DOI :
10.1109/ICM.2012.6471379
