• DocumentCode
    59953
  • Title

    Thermal Analysis of High-Power Multichip COB Light-Emitting Diodes With Different Chip Sizes

  • Author

    Shang-Ping Ying ; Wei-Bo Shen

  • Author_Institution
    Dept. of Optoelectron. Syst. Eng., Minghsin Univ. of Sci. & Technol., Hsinchu, Taiwan
  • Volume
    62
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    896
  • Lastpage
    901
  • Abstract
    This paper demonstrates the thermal analysis of high-power light-emitting diodes (LEDs) with various chip sizes, in the same chip-on-board (COB) package and with the same total chip size and input power. The 4-, 9-, 25-, and 100-chip multichip COB LEDs with chip-side lengths of 1500, 1000, 600, and 300 μm were used. The simulation results indicate that the maximal junction temperature of the multichip COB LEDs increased as the number of chips in the multichip COB LED decreased. In addition, with the same input power, the difference between the maximal and minimal junction temperatures of the multichip COB LED increased as the number of chips in multichip COB LEDs increased. That is, if the multichip COB LED contains a few number of large chips, the output power of each chip will drop but uniform owing to the high junction temperature and low temperature difference. Oppositely, if the multichip COB LED contains a lot of small chips, the output power of the chips at the corners will be higher than other chips, but the output power of each chip will be nonuniform owing to the nonuniform junction temperature distribution.
  • Keywords
    chip-on-board packaging; light emitting diodes; multichip modules; temperature distribution; thermal analysis; chip size; chip-on-board package; chip-side length; high-power multichip COB LED; light-emitting diode; nonuniform junction temperature distribution; size 1000 mum; size 1500 mum; size 300 mum; size 600 mum; temperature difference; thermal analysis; Heating; Junctions; Light emitting diodes; Power generation; Semiconductor device measurement; Temperature distribution; Temperature measurement; Chip-on-board (COB) technology; junction temperature; light-emitting diodes (LEDs); light-emitting diodes (LEDs).;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2390255
  • Filename
    7036129