Investigation for effective XRD profile factors for high piezo-electric property

Author

Tsuchiya, K. ; Nakada, Yohei ; Uetsuji, Y.

Author_Institution

Sch. of Precision Eng., Tokai Univ., Hiratsuka, Japan

fYear

2012

fDate

12-14 Dec. 2012

Firstpage

91

Lastpage

92

Abstract

In this paper, the effective XRD profile factors for the improvement of piezoelectric characteristic especially for BaTiO₃ well known as unleaded piezoelectric material were specified by analysis software RIETAN-2000, under the conditions based on literature review by other research groups such as the improvement of piezoelectric property due to the increase of the crystallite size, the decrease of lattice strain for the piezoelectric material, and the decrease of half value width for X-ray diffraction pattern improving the crystalline. As a result, it was clear that a decrease in the isotropic lattice strain was effective to show high piezoelectricity.

Keywords

X-ray diffraction; barium compounds; crystallites; deformation; piezoelectric materials; piezoelectricity; BaTiO₃; RIETAN-2000 analysis software; X-ray diffraction; XRD profile factors; crystallite size; lattice strain; piezoelectric property; unleaded piezoelectric material; Crystals; Lattices; Strain; X-ray diffraction; X-ray scattering; Xenon;

fLanguage

English

Publisher

ieee

Conference_Titel

Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2012 Conference on

Conference_Location

Melbourne, VIC

ISSN

1097-2137

Print_ISBN

978-1-4673-3047-3

Type

conf

DOI

10.1109/COMMAD.2012.6472375

Filename

6472375