Title :
Investigation for effective XRD profile factors for high piezo-electric property
Author :
Tsuchiya, K. ; Nakada, Yohei ; Uetsuji, Y.
Author_Institution :
Sch. of Precision Eng., Tokai Univ., Hiratsuka, Japan
Abstract :
In this paper, the effective XRD profile factors for the improvement of piezoelectric characteristic especially for BaTiO3 well known as unleaded piezoelectric material were specified by analysis software RIETAN-2000, under the conditions based on literature review by other research groups such as the improvement of piezoelectric property due to the increase of the crystallite size, the decrease of lattice strain for the piezoelectric material, and the decrease of half value width for X-ray diffraction pattern improving the crystalline. As a result, it was clear that a decrease in the isotropic lattice strain was effective to show high piezoelectricity.
Keywords :
X-ray diffraction; barium compounds; crystallites; deformation; piezoelectric materials; piezoelectricity; BaTiO3; RIETAN-2000 analysis software; X-ray diffraction; XRD profile factors; crystallite size; lattice strain; piezoelectric property; unleaded piezoelectric material; Crystals; Lattices; Strain; X-ray diffraction; X-ray scattering; Xenon;
Conference_Titel :
Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2012 Conference on
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4673-3047-3
DOI :
10.1109/COMMAD.2012.6472375
