Title :
Metamorphic buffer layers for mid-infrared emitting semiconductor lasers
Author :
Mawst, L.J. ; Botez, D. ; Kuech, T.F.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin - Madison, Madison, WI, USA
Abstract :
We have investigated the use of Metamorphic Buffer Layer (MBL) structures for the realization mid-infrared semiconductor lasers employing either interband or intersubband transitions. The resulting surface morphology of the MBL is generally cross-hatched along the orthogonal <;110> directions. This surface morphology may negatively impact device structures grown on top of the MBL. We have employed two different techniques to improve the surface morphology of MBLs, while maintaining an epiappropriate surface chemical composition and structure: (1) Introduction of Sb as a surfactant to create novel step-graded MBLs; and (2) Chemical-Mechanical-Polishing (CMP) of the MBL followed by MOCVD regrowth of layers atop the MBL.
Keywords :
MOCVD; buffer layers; chemical mechanical polishing; chemical structure; infrared sources; laser transitions; quantum cascade lasers; surface chemistry; surface composition; surface morphology; surfactants; CMP; MOCVD regrowth; chemical-mechanical polishing; cross-hatched surface morphology; device structures; interband transition; intersubband transition; metamorphic buffer layers; midinfrared emitting semiconductor lasers; orthogonal <;110> directions; step-graded MBL structures; surface chemical composition; surface chemical structure; surfactant; Buffer layers; Indium phosphide; Quantum cascade lasers; Substrates; Surface emitting lasers; Surface morphology;
Conference_Titel :
Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2012 Conference on
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4673-3047-3
DOI :
10.1109/COMMAD.2012.6472379