Title :
Dark field optical tweezers for studying nanoparticle dynamics
Author :
Toe, Wen Jun ; Pearce, K. ; Wang, F. ; Reece, Peter J.
Author_Institution :
Sch. of Phys., Univ. of New South Wales, Sydney, NSW, Australia
Abstract :
We report a method of characterising physical and optical properties of nanoparticles using optical tweezers combined with dark field microscopy. The technique uses measurements from Brownian dynamics of the trapped nanoparticles to determine localised surface plasmon resonance (LSPR) spectroscopy to determine nanoparticle size information.
Keywords :
Brownian motion; nanoparticles; optical microscopy; particle size; radiation pressure; surface plasmon resonance; Brownian dynamics; LSPR spectroscopy; dark field microscopy; dark field optical tweezers; localised surface plasmon resonance; nanoparticle dynamics; nanoparticle size; optical properties; physical properties; trapped nanoparticles; Charge carrier processes; Integrated optics; Nanoparticles; Optical imaging; Optical interferometry; Optical scattering; Optical sensors;
Conference_Titel :
Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2012 Conference on
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4673-3047-3
DOI :
10.1109/COMMAD.2012.6472381
