• DocumentCode
    599916
  • Title

    Corner and short-channel effects in recessed channel dopant segregated Schottky barrier MOSFETs

  • Author

    Hsia, J.K. ; Shih, C.H.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chi Nan Univ., Nantou, Taiwan
  • fYear
    2012
  • fDate
    12-14 Dec. 2012
  • Firstpage
    207
  • Lastpage
    208
  • Abstract
    This work numerically examines the corner and short-channel effects in dopant segregated Schottky barrier MOSFETs (DS-SBMOS) with recessed channel. The recessed channel suppresses effectively the short-channel effect in the DS-SBMOS devices, whereas the recessed channel and oxide corners leads to a lower on-state current and worse on-off switching. The recessed depth plays the key role to optimize the on-current and subthreshold swing in the recessed channel DS-SBMOS.
  • Keywords
    MOSFET; Schottky barriers; semiconductor doping; DS-SBMOS; Schottky barrier MOSFET; channel dopant; corner-channel effects; short-channel effects; Educational institutions; Electrical engineering; Logic gates; MOSFETs; Metals; Schottky barriers; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2012 Conference on
  • Conference_Location
    Melbourne, VIC
  • ISSN
    1097-2137
  • Print_ISBN
    978-1-4673-3047-3
  • Type

    conf

  • DOI
    10.1109/COMMAD.2012.6472433
  • Filename
    6472433