DocumentCode
599916
Title
Corner and short-channel effects in recessed channel dopant segregated Schottky barrier MOSFETs
Author
Hsia, J.K. ; Shih, C.H.
Author_Institution
Dept. of Electr. Eng., Nat. Chi Nan Univ., Nantou, Taiwan
fYear
2012
fDate
12-14 Dec. 2012
Firstpage
207
Lastpage
208
Abstract
This work numerically examines the corner and short-channel effects in dopant segregated Schottky barrier MOSFETs (DS-SBMOS) with recessed channel. The recessed channel suppresses effectively the short-channel effect in the DS-SBMOS devices, whereas the recessed channel and oxide corners leads to a lower on-state current and worse on-off switching. The recessed depth plays the key role to optimize the on-current and subthreshold swing in the recessed channel DS-SBMOS.
Keywords
MOSFET; Schottky barriers; semiconductor doping; DS-SBMOS; Schottky barrier MOSFET; channel dopant; corner-channel effects; short-channel effects; Educational institutions; Electrical engineering; Logic gates; MOSFETs; Metals; Schottky barriers; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2012 Conference on
Conference_Location
Melbourne, VIC
ISSN
1097-2137
Print_ISBN
978-1-4673-3047-3
Type
conf
DOI
10.1109/COMMAD.2012.6472433
Filename
6472433
Link To Document